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JEOL Ltd | 論文
- Fluoroalkyl end-capped oligomers possessing nonflammable and flammable characteristics in silica gel matrices after calcination at 800℃ under atmospheric conditions
- DIRECT DETERMINATION OF OPIUM ALKALOID-BOVINE SERUM ALBUMIN CONJUGATE BY MATRIX-ASSISTED LASER DESORPTION/IONIZATION MASS SPECTROMETRY
- High-definition image processing system for FE-SEM
- Scanning Tunneling Microscopy Observation of the Formation of the Smallest Dimer-Adatom-Stacking-fault Domain on a Quenched Si(111) Surface
- Detection of the flip-flop motion of buckled dimers on a Ge(001) surface by STM
- Little Influence of Kinks on the Formation of c(4×2)Domains in a Si(001)Surface at Low Temperature
- Scanning Tunneling Microscopy Observation of Ar-Ion-Bombarded Si(001) Surfaces and Regrowth Processes by Thermal Annealing
- Adsorption of Bismuth on Si(110) Surfaces Studied by Scanning Tunneling Microscopy
- Dynamic Observation of Ag Desorptiom Process onm Si(111) Surface by High-Termperature Scanning Tunneling Mieroscopy
- High-Temperature Scanning Tunneling Microscopy Observation of a (15, 17, 1) Facet Structure on a Si(110) Surface
- High-Temperature Scanning Tunneling Microscopy Study of the Phase Transition of 16-Structure Appearing on a Si(110) Surface
- Application of Nano-Diffraction to Local Structure Analysis of Amorphous Pd_Si_ Alloy Thin Films
- Low Energy Focused Ion Beam System and Application to Low Damage Microprocess : Etching and Deposition Technology
- Low Energy Focused Ion Beam System and Application to Low Damage Microprocess
- Real-Time Observation of (1×1)-(7×7) Phase Transition on Vicinal Si(111) Surfaces by Scanning Tunneling Microscopy
- Observation of Element-Specific Energy-Filtered X-Ray Photoemission Electron Microscopy Images of Au on Ta Using a Wien Filter Type Energy Analyzer
- Observation of Energy-Filtered Image for X-Ray Photoemission Electron Microscopy (EXPEEM) Using a Retarding Wien-Filter Energy Analyzer
- New 300kV Energy-Filtering Field Emission Electron Microscope : Instrumentation, Measurement, and Fabrication Technology
- Surface Superstructures Fluctuating in the Quasi-One-Dimensional Organic Conductor β-(BEDT-TTF)_2PF_6 Observed by Scanning Tunneling Microscopy ( Scanning Tunneling Microscopy)
- Transmiccion electron microscopy study of a semiconducting SrTiO_3 ceramic condenser