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JEOL LTD | 論文
- Cross-Sectional Transmission Electron Microscopy of ZnO Tetrapod-Like Particles
- A Newly Developed 300 kV Field-Emission Analytical Transmission Electrom Microscope
- High-resolution transmission electron microscopy and electron energy-loss spectroscopy study of polycrystalline-Si/ZrO_2/SiO_2/Si metal-oxide-semiconductor structures
- Transfer doublet and an elaborated phase plate holder for 120kV electron-phase microscope
- Quantitative Analysis of Short-Range Order Diffuse Scattering in Cu-27.5 at%Pd Alloy with Energy-Filtered Electron Diffraction
- Retrieval process of high-resolution HAADF-STEM images
- Artificial bright spots in atomic-resolution high-angle annular dark field STEM images
- High-resolution transmission electron microscopy of Fe-Al powder particles
- A new specimen preparation method for cross-section TEM using diamond powders
- EELS elemental mapping of a DRAM with FE-TEM
- EDS elemental mapping of a DRAM with an FE-TEM
- A preparation method of sections of fine particles and cross-sectional transmission electron microscopy of Ni powder
- Preparation of Novel Fluoroalkyl End-Capped Trimethoxyvinylsilane Oligomeric Nanoparticle-Encapsulated Binaphthol : Encapsulated Binaphthol Remaining Thermally Stable Even at 800℃
- In-Plane Orientations and Grain Boundaries of YBa_2Cu_3O_ Thin Films on (001) MgO Substrates Grown by Metalorganic Chemical Vapor Deposition
- Mapping Contact Potential Differences with Noncontact Atomic Force Microscope Using Resonance Frequency Shift versus Sample Bias Voltage Curves
- HAADF-STEM study on the early stage of precipitation in aged Al-Ag alloys
- Simultaneous Observation of Millisecond Dynamics in Atomistic Structure, Force and Conductance on the Basis of Transmission Electron Microscopy : Surface, Interfaces, and Films
- The Application of the Correlation Method for the EB (Electron Beam) Exposure System : Lithography Technology
- The Application of the Correlation Method for the EB (Electron Beam) Exposure System
- Performance of a Focused-Ion-Beam Implanter with Tilt-Writing Function : Beam Induced Physics and Chemistry