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JEOL LTD. | 論文
- Experimental Evidence of Stability of Pt Clusters on and in Carbon Particles
- Structural Control of Silicon Oxide Particles by Oxygen Partial Pressure in RF Plasma
- Observation of Energy-Filtered Image for X-Ray Photoemission Electron Microscopy (EXPEEM) Using a Retarding Wien-Filter Energy Analyzer
- Transmission Electron Microscopy Study on the Grain Boundaries and Magnetic Domains in Nd-Fe-B Based Magnets
- New 300kV Energy-Filtering Field Emission Electron Microscope : Instrumentation, Measurement, and Fabrication Technology
- Effect of Nb on Transformation Kinetics and Mechanical Properties in Zr-Al-Ni-Cu Metallic Glasses
- Surface Superstructures Fluctuating in the Quasi-One-Dimensional Organic Conductor β-(BEDT-TTF)_2PF_6 Observed by Scanning Tunneling Microscopy ( Scanning Tunneling Microscopy)
- 27pA16P 2次元PIC-MCCによる非一様磁場中シース形成の解析(プラズマ基礎・応用)
- Scanning Capacitace Microscope/Atomic Force Microscope/Scanning Tunneling Microscope Study of Ion-Implanted Silicon Surfaces
- Adsorption and Desorption of AlCl_3 on Si(111)7×7 Observed by Scanning Tunneling Microscopy and Atomic Force Microscopy
- Changes in Grain Size and Grain Storage Protein of Rice (Oryza Sativa L.) in Response to Elevated UV-B Radiation under Outdoor Conditions
- Temperature Dependence of the Raman Shift of the A_ mode for NdGaO_3 Crystal
- 119 Genetic Study of Correlation between UVB-sensitivity and Mutation of CPD Photolyase in UVB-sensitive and UVB-resistant Rice Cultivars(Effects of UV & sunlight, Abstracts of the 46th Annual Meeting of the Japan Radiation Research Society)
- The First-Order Raman Spectra and Lattice Dynamics for YAlO_3 Crystal
- The First-Order Raman Spectra and Lattice Dynamics for YAlO_3 Crystal
- A Newly Developed 300 kV Field-Emission Analytical Transmission Electrom Microscope
- Charging Effects on SEM/SIM Contrast of Metal/Insulator System in Various Metallic Coating Conditions
- Magnetic-Field-Free Objective Lens around a Specimen for Observing Fine Structure of Ferromagnetic Materials in a Transmission Electron Microscope
- Inductively-Coupled r.f. Plasma Reactor for Destruction of Ozone Depleting Substances
- High-resolution transmission electron microscopy and electron energy-loss spectroscopy study of polycrystalline-Si/ZrO_2/SiO_2/Si metal-oxide-semiconductor structures