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Ishikawa Seisakusho Ltd. | 論文
- Direct Detection of Radiocarbon Using Accelerator Techniques and Its Application to Age Measurements
- Air-Stable p-Type and n-Type Carbon Nanotube Field-Effect Transistors with Top-Gate Structure on SiN_x Passivation Films Formed by Catalytic Chemical Vapor Deposition
- Preparation of Low-Stress SiN_x Films by Catalytic Chemical Vapor Deposition at Low Temperatures
- Improvement of Deposition Rate by Sandblasting of Tungsten Wire in Catalytic Chemical Vapor Deposition
- Moisture-Resistive Properties of SiN_x Films Prepared by Catalytic Chemical Vapor Deposition below 100℃ for Flexible Organic Light-Emitting Diode Displays
- Effect of Atomic Hydrogen on Preparation of Highly Moisture-Resistive SiN_x Films at Low Substrate Temperatures
- Highly Moisture-Resistive SiN_x Films Prepared by Catalytic Chemical Vapor Deposition
- Influence of Buffer Layers on Lead Magnesium Niobate Titanate Thin Films Prepared by Pulsed Laser Ablation
- Effect of Oxygen Pressure on (Ba_xSr_)TiO_3 Thin Films by Pulsed Laser Ablation
- Estimation of Correlation of Acoustic Reciprocal Transmissions Using Central Equatorial Pacific Tomography Data
- Estimation of the Travel Time Using the New Measurement Technique for Long-range Transmission
- Estimation of the Stability of Acoustic Reciprocal Transmission in Long-Range Propagation at the Central Equatorial Pacific
- Estimation of the Stability of Acoustic Multipath in Long-Range Propagation
- Estimation of the Stability of Acoustic Multipath in Long-Range Propagation at the Western Equatorial Pacific
- MHz VCO Resonators with ZnO/ELINVAR Structures : SAW and Communication Devices
- VCO Resonators Using ZnO Sputtered Film : V: PIZOELECTRIC VIBRATOR
- A WSi Base Electrode and a Heavily-Doped Thin Base Layer for High-Speed and Low-Power InGaP/GaAs HBTs
- New Technologies of a WSi Base Electrode and a Heavily-Doped Thin Base Layer for High-Performance InGaP/GaAs HBTs
- Simultaneous Transmission of Tomography Transceivers Using Multiple M-Sequence Signals
- Low-Temperature Crystallization of Sol-Gel-Derived Pb (Zr, Ti)O_3 Thin Films