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Institute of Industrial Science | 論文
- 2P304 ベイズ推定を用いた運命決定を行う反応の可逆性と情報抽出の効率(数理生物学,第48回日本生物物理学会年会)
- Synthesis of New Mono-Carbonitride(W, Mo)(C, N) Powder by Heating W-Mo Alloy+C Mixed Powder in High-Pressure Nitrogen Gas (特集 硬質材料)
- Synthesis of New Mono-Carbonitride Mo(C,N) Powder by Heating Mo+C Mixed Powder in High-Pressure Nitrogen Gas (特集 硬質材料)
- Synthesis New Cabonitride W(C, N)Powder by Heating W+C Mixed Powder in High Pressure Nitrogen Gas
- Origin of Critical Substrate Bias in Variable Threshold Voltage Complementary MOS (VTCMOS)
- Origin of Critical Substrate Bias in Variable Threshold Voltage CMOS
- Applicabilities of Equations of σ_m=ψK_S_^ and σ_d^=σ_O^+Ka^ to Soda Lime Glass
- Effects of Test Piece Length,Composition and Measuring Atmosphere on PTCR Characteristic of Porous BaTiO_3-Based Vacuum-Sintered Compacts Added with Partially Oxidized Ti Powder
- Applicabilities of σm=ψKICSmf1/2 and σd-1=σ0-1+Ka1/2 to KIC Estimation of Hardmetals, Cermets and Ceramics (特集 硬質材料)
- 3P316 自主・自発性の起源に関する情報論的考察(数理生物学,第48回日本生物物理学会年会)
- Short Channel Effect on Variable Threshold Voltage CMOS(VTCMOS)
- Short Channel Effect on Variable Threshold Voltage CMOS(VTCMOS)
- Short Channel Effect on Variable Threshold Voltage CMOS(VTCMOS) (2001 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices(AWAD 2001))
- Kenkyu kaisetu "Atomic force microscopy utilizing subangstrom cantilever amplitudes"
- A Mechanism of 13% Lattice Expansion in C_ FCC(110) Thin Films Grown on the GaAs(001) As-rich Surface
- Wide-Range V_ Controllable SOTB (Silicon on Thin BOX) Integrated with Bulk CMOS Featuring Fully Silicided NiSi Gate Electrode
- Effect of Sintering Cooling Rate on V Segregation Amount at WC/Co Interface in VC-doped WC-Co Fine-Grained Hardmetal
- Optimum Device Parameters and Scalability of Variable Threshold CMOS (VTCMOS)
- A Consideration on Grain Growth in WC-Co Fine Grained Hardmetal by Numerical Calculation Based on Alloy Model with Three Kinds of Grain Sizes (特集 硬質材料)
- Development of Two New Methods for Estimating Fracture Stress of Fractured Hard or Brittle Materials from Its Fragments (特集 硬質材料)