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Information Equipment Research Laboratory | 論文
- Fine adhesion patterning and aligned nuclei orientation of mesenchymal stem cell on narrow line-width of silicone rubber implanted by carbon negative ions (第50回真空に関する連合講演会プロシーディングス)
- Adsorption Site Determination by Reflection High-Energy Electron Diffraction Combined with Interface Energy Calculation
- Two Dimensional Structure and Growth Mode of Ultrathin Ce Film on a Mo(110) Surface
- Effect of C^-implantation on Nerve-Cell Attachment to Polystyrene Films
- SEM Observation of Ag Crystallites Growing on Graphite Substrate
- Index-Free Full-Text Search Function Installed into Optical Disk Drive : Systems and Applications
- Index-Free Full-Text Search Function Installed into Optical Disk Drive
- Room Temperature Coulomb Diamond Characteristic of Single Electron Transistor Made by AFM Nano-Oxidation Process
- Experimental and Simulated Results of Room Temperature Single Electron Transistor Formed by Atomic Force Microscopy Nano-Oxidation Process
- Metal-Based Room-Temperature Operating Single Electron Devices Using Scanning Probe Oxidation
- Room Temperature Coulomb Oscillation for Single Electron Transistor on Atomically Flat Ti/α-Al_2O_3 Substrate Made by Pulse-Mode AFM Nano-Oxidation Process
- Single Electron Transistor on Atomically Flat α-Al_2O_3 Substrate Made by AFM Nano-Oxidation Process
- Recording and Erasing Characteristics at a Wavelength of 680 nm for a Phase-Change Disk Designed for 830 nm Wavelength
- Thin Injection-Molded Substrate for High Density Recording Phase-Change Rewritable Optical Disk
- Monte Carlo Simulation of Emission Efficiency of Cone-shaped Metal-Insulator-Semiconductor Cathode
- Stability of Field Emission Current from Boron-Doped Diamond Thin Films Terminated with Hydrogen and Oxygen
- Influences of Ambient Gases on the Emission Characteristics of Nickel-Deposited Field Emitters for Vacuum Microelectronics
- Relationship between Effective Work Functions and Noise Powers of Emission Currents in Nickel-Deposited Field Emitters
- A High Performance Single Chip LSI for Error Correction of Optical Disk Memory : DRIVE TECHNOLOGY I
- Single Electron Memory at Romm Temperature: Experiment and Simulation