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IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A. | 論文
- Dynamics of Defects in Strained Silicon, Strained SiGe and Strained Germanium
- Integration of Photo-Patternable Low-$\kappa$ Material into Advanced Cu Back-End-Of-The-Line
- Vertical Light-Emitting Diode Fabrication by Controlled Spalling
- Vertical Light-Emitting Diode Fabrication by Controlled Spalling