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IBM Research Division | 論文
- Full-Wafer Technology for Large-Scale Laser Fabrication and Testing : Micro/nanofabrication and Devices
- Electron Beam Lithography-Tools and Applications : Electron Beam Lithography
- Element-Specific Contrast in Scannimg Tunnelimg Microscopy via Resonant Tunneling
- High-K/Metal Gate MOSFETs における新しいレイアウト依存性
- Electron Beam Lithography-Tools and Applications