Element-Specific Contrast in Scannimg Tunnelimg Microscopy via Resonant Tunneling
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概要
- 論文の詳細を見る
An element-specific version of scanning tunneling spectroscopy for metals is presented. Contrast between two metals is achieved by resonant tunneling via surface states and image states. These states are characterized independently by inverse photoemission. Image states provide elemental identification via the work function, since their energy is correlated with the local work function. Element-specific surface states produce contrast at higher spatial resolution, but the contrast is smaller than that for image states. These imaging techniques are used to study the growth modes of Cu stripes on stepped W(110) and Mo(110) surfaces.
- 社団法人応用物理学会の論文
- 1996-06-30
著者
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Himpsel Franz
Department Of Physics University Of Wisconsin
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JUNG Thomas
IBM Research Division
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SCHILITTLER Reto
IBM Research Division
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GIMZEWSKI Jim
IBM Research Division
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Jung T
Ibm Research Division
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Schlittler Reto
IBM Research Division