スポンサーリンク

Electrotechnical Laboratory:(Present address)FEL Engineering Corp. | 論文

• Characterization of Hydrogenated Amorphous Silicon Films by a Pulsed Positron Beam
• Slow Positron Pulsing System for Variable Energy Positron Lifetime Spectroscopy
• Decay Rate Plot of Stored Beam Current and Touschek Limit of Current-Lifetime Product
• Emission-Angle Dependence of Electron Transmission through Thick Layers with Initial Energy of 24.8 MeV
• Large Area Exposure in Synchrotron Radiation Lithography Utilizing the Steering of the Electron Beam in the Storage Ring
• Average Energy Loss of 24.8-MeV Electrons after Passing through and Backscattering from Thick Layers of C,Al,Cu,and Pb
• Anomalous Energy Loss and Straggling of 24.8 MeV Electrons through Thin single Crystals of Germanium

スポンサーリンク