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EIKO Engineering Co., Ltd. | 論文
- Design of a 200 kV Focused Ion Beam Surface Analysis System
- Application of a Retarding-type Mott Analyzer to Observation of Magnetic Domains
- In Situ Observations of GaAs Initial Growth on Si Substrates Studied Using an Ultrahigh-Vacuum Transmission-Electron Microscope/Molecular-Beam Epitaxy System