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ECE Department, University of California | 論文
- Growth and Electrical Characterization of N-face AlGaN/GaN Heterostructures
- Growth and Electrical Characterization of N-face AlGaN/GaN Heterostructures
- Linking Register-Transfer and Physical Levels of Design (Special Issue on Synthesis and Verification of Hardware Design)
- Estimation of Hot Electron Relaxation Time in GaN Using Hot Electron Transistors
- Estimation of Hot Electron Relaxation Time in GaN Using Hot Electron Transistors