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Devices and Materials Laboratory, LG Corporate Institute of Technology | 論文
- Suppression of Jitter Bump GeSbTe Phase-Change Optical Disk
- X-Ray Photoelectron Spectroscopy Study of Pt-Oxide Thin Films Deposited by Reactive Sputtering Using O_2/Ar Gas Mixtures
- Investigation of Crystallization Behavior of Sputter-Deposited Nitrogen-Doped Amorphous Ge_2Sb_2Te_5 Thin Films
- Effect of Oxygen to Argon Ratio on Growth of Bi_4Ti_3O_ Thin Films on Ir and IrO_2 Prepared by Radio-Frequency Magnetron Sputtering