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Department of Electronics Engineering, National Thing Hua University | 論文
- Modeling the Turn-off Characteristics of Insulated-Gate Bipolar Transistor
- Hot Carrier Degradation in Deep Sub-Micron Nitride Spacer Lightly Doped Drain N-Channel Metal-Oxide-Semiconductor Transistors
- Electrical Properties of High-Temperature Annealed Boron-Implanted Hg_Cd_Te
- Temperature Dependence of Shallow-Trench-Isolation Mechanical Stress on n-Channel Metal-Oxide-Semiconductor Field-Effect Transistors