スポンサーリンク
Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184-8588, Japan | 論文
- Micrometer-Scale Local-Oxidation Lithography Using Scanning Probe Microscopy
- Local Oxidation of Si Surfaces by Tapping-Mode Scanning Probe Microscopy: Size Dependence of Oxide Wires on Dynamic Properties of Cantilever
- Magneto-Optical Properties and Size Effect of Ferromagnetic Metal Nanoparticles
- Control of Tunnel Resistance of Nanogaps by Field-Emission-Induced Electromigration