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Department of Electrical Engineering, Faculty of Engineering, Gifu University | 論文
- Reliability of the Modulation Transfer Function of Radiographic Screen-Film Systems Measured by the Slit Method
- Comparison of Several Methods for Measuring the Wiener Spectrum of Radiographic Screen-Film Systems
- Evaluation of Radiographic Images by Using Sequential Dependency
- Evaluation of Images for Computed Tomography Scanners by Entropy
- Electrical Properties of Chalcogenide Glasses of Te-Se-Ge and Te-Se-Sb Systems
- Thermal Switching in Chalcogenide Glass Semiconductors
- Difference of Thermal Properties between Threshold Type and Memory Type Chalcogenide Glass Semiconductors
- Crystallization Rates of the Chalcogenide Glasses by Heat Treatment
- Dependences of the Resistivity and the Switching on Composition in Chalcogenide Glasses
- Temperature Dependence of the Switching Phenomena in Te-Se-Ge Glass
- Evaluation of the Wiener Spectrum of Radiographic Screen-Film Systems by Entropy