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DEPARTMENT OF APPLIED PHYSICS, OSAKA UNIVERSITY | 論文
- Autoimmune Regulator (AIRE) Gene Is Expressed in Human Activated CD4^+ T-Cells and Regulated by Mitogen-Activated Protein Kinase Pathway
- Quantum Chemical Study of the Oxidation Sites in Hydrogen- and Water-Terminated Si Dimers : Attempt to Understand the Si-Si Back-Bond Oxidation on the Si Surface
- Direct Evidence of Chemical Contribution to Surface-enhanced Hyper-Raman Scattering
- Locally Controllable Image Amplification by Two-Wave Coupling with a BSO Crystal
- Desorption Study of Carbon Monoxide from Molybdenum Surface by Means of Thermal Desorption Spectroscopy and Auger Electron spectroscopy
- Measurement of Electron Cyclotron Emission from JIPP T-II Plasma
- Fourier Transform Spectroscopy of Electron Cyclotron Emission from JIPP T-II Torus
- Quantum Chemical Study on the Oxidation of Hydrogen-Terminated Silicon Surface by Oxygen Anions
- Electron Impact Spectra of Mercury in Intermediate Energies
- Spin-Polarization and Differential Cross Section of Electron-Mercury Inelastic Scattering
- Solution of the Knapsack Problem by Deoxyribonucleic Acid Computing
- Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images
- Development of Monte Carlo Simulation of Generation of Continuous and Characteristic X-Rays by Electron Impact (Short Note)
- Fourier analysis of HRTEM image deterioration caused by mechanical vibration
- Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum
- Real-time observation of spherical aberration-free phase image using high-speed image processing CCD video camera
- Flattening of Surface by Sputter-Etching with Low-Energy Ions : Instrumentation, Measurement, and Fabrication Technology
- Monte Carlo Simulation Study of Backscattered Electron Imaging in a Chemical Vapor Deposition Scanning Electron Microscope
- Monte Carlo Simulation of Generations of Continuous and Characteristic X-Rays by Electron Impact
- Optimization of voltage axis alignment in high-resolution electron microscopy