スポンサーリンク
College of Engineering, Nihon University, Koriyama, Fukushima 963-8642, Japan | 論文
- Characteristics of Sol–Gel-Derived and Crystallized HfO2 Thin Films Dependent on Sol Solution
- Schottky-barrier-induced AC surface photovoltages in Au-precipitated n-type Si(001) surfaces
- Characterization of Sol–Gel Derived and Crystallized ZrO2 Thin Films
- Temperature-Programmed Desorption Analyses of Sol–Gel Deposited and Crystallized HfO2 Films
- Erratum: ``Schottky-Barrier-Induced AC Surface Photovoltages in Au-Precipitated n-Type Si(001) Surfaces''
- Anomalous Oxide Charge Variation Identified by Alternating Current Surface Photovoltage Method in Cr-Aqueous-Solution-Rinsed p-Type Si(001) Wafers Exposed to Air
- Direct Observation of Au Nanoclusters at Au/Si Interface and Enhanced SiO