Yasuoka Kenji | School of Science for Open and Environmental System, Graduate School of Science and Technology, Keio University, Yokohama 223-8522, Japan

スポンサーリンク

概要

関連著者

Hirose Kazuyuki
Institute Of Space And Astronautical Science
Seki Hiroshi
School of Science for Open and Environmental System, Graduate School of Science and Technology, Keio University, Yokohama 223-8522, Japan
Shibuya Yasuhiro
Electrical and Electronic Engineering, Graduate School of Engineering, Tokyo City University, Setagaya, Tokyo 158-8557, Japan
Kobayashi Daisuke
Institute of Space and Astronautical Science, JAXA, Sagamihara 252-5210, Japan
Nohira Hiroshi
Electrical and Electronic Engineering, Graduate School of Engineering, Tokyo City University, Setagaya, Tokyo 158-8557, Japan
Yasuoka Kenji
School of Science for Open and Environmental System, Graduate School of Science and Technology, Keio University, Yokohama 223-8522, Japan

著作論文

Estimation of Breakdown Electric-Field Strength While Reflecting Local Structures of SiO Gate Dielectrics Using First-Principles Molecular Orbital Calculation Technique (Special Issue : Solid State Devices and Materials (2))

スポンサーリンク