Sumi Tadashi | The authors are with Electronics Research Laboratory, Matsushita Electronics Corporation
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- 同名の論文著者
- The authors are with Electronics Research Laboratory, Matsushita Electronics Corporationの論文著者
The authors are with Electronics Research Laboratory, Matsushita Electronics Corporation | 論文
- Time-Dependent Leakage Current Behavior of Integrated Ba_Sr_TiO_3 Thin Film Capacitors during Stressing
- Temperature-Dependent Current-Voltage Characteristics of Fully Processed Ba_Sr_TiO_3 Capacitors Integrated in a Silicon Device
- Application of Ferroelectric Thin Films to Si Devices (Special Issue on Quarter Micron Si Device and Process Technologies)
- Ferroelectric Memory Circuit Technology and the Application to Contactless IC Card(Special Issue on Advanced Memory Devices Using High-ε and Ferroelectric Films)