Barbolla Juan | Department Electricidad y Electrdnica, ETSI Telecomunicacion, Universidad de Valladolid, Campus Miguel Delibes s-n
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- 同名の論文著者
- Department Electricidad y Electrdnica, ETSI Telecomunicacion, Universidad de Valladolid, Campus Miguel Delibes s-nの論文著者
Department Electricidad y Electrdnica, ETSI Telecomunicacion, Universidad de Valladolid, Campus Miguel Delibes s-n | 論文
- Electrical Characterization of Al/SiN_x:H/n and p-In_Ga_As Structures by Deep-Level Transient Spectroscopy and Conductance Transient Techniques
- Electrical Characterization of Low Nitrogen Content Plasma Deposited and Rapid Thermal Annealed Al/SiN_x : H/InP Metal-Insulator-Semiconductor Structures
- Interfacial State Density and Conductance-Transient Three-Dimensional Profiling of Disordered-Induced Gap States on Metal Insulator Semiconductor Capacitors Fabricated from Electron-Cyclotron Resonance Plasma-Enhanced Chemical Vapor Deposited SiOxNyHz Fil
- Experimental Verification of Direct Tunneling Assisted Electron Capture of Disordered-Induced Gap States in Metal-Insulator-Semiconductor Structures