Lee Nam-Hyun | Department of Electronic and Electrical Engineering, Pohang University of Science and Technology, POSTECH, Pohang, Gyeongbuk 790-784, Korea

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概要

• 同名の論文著者
• Department of Electronic and Electrical Engineering, Pohang University of Science and Technology, POSTECH, Pohang, Gyeongbuk 790-784, Koreaの論文著者

関連著者

• Kang Bongkoo

  Department Of Electrical Engineering Pohang University Of Science And Technology

• Lee Nam-Hyun

  Department of Electronic and Electrical Engineering, Pohang University of Science and Technology, POSTECH, Pohang, Gyeongbuk 790-784, Korea

• Kim Hyung-wook

  Memory Division, Samsung Electronics, Hwasung, Gyeonggi 445-701, Korea

著作論文

• Impact of Dynamic Stress on Reliability of Nanoscale n-Channel Metal-Oxide-Semiconductor Field-Effect Transistors with SiON Gate Dielectric Operating in a Complementary Metal-Oxide-Semiconductor Inverter at Elevated Temperature (Special Issue : Solid Stat

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