Harada Hirofumi | National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan

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概要

• 同名の論文著者
• National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japanの論文著者

関連著者

• SEKIGUCHI Takashi

  National Insitute for Materials Science

• SAMESHIMA Takashi

  Meiji University

• TACHIBANA Tomihisa

  Meiji University

• KOJIMA Takuto

  Toyota Technological Institute

• ARAFUNE Koji

  University of Hyogo

• Ohshita Yoshio

  Toyota Technological Inst. Nagoya Jpn

• Ogura Atsushi

  Meiji Univ. Kawasaki Jpn

• Kakimoto Koichi

  Kyushu University, Fukuoka 816-8580, Japan

• Miyamura Yoshiji

  National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan

• Harada Hirofumi

  National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan

著作論文

• Impact of Light-Element Impurities on Crystalline Defect Generation in Silicon Wafer (Special Issue : Solid State Devices and Materials (1))

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