Lee Jaehong | Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Korea
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概要
- Lee Jaehongの詳細を見る
- 同名の論文著者
- Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Koreaの論文著者
関連著者
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Shin Hyungcheol
Inter-university Semiconductor Research Center (isrc)
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Lee Jaehong
Inter-University Semiconductor Research Center (ISRC), School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Korea
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Lee Jaehong
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Korea
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Jeon Jongwook
Inter-university Semiconductor Research Center (isrc) And School Of Ee Seoul National University
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Park Chan
Department Of Anatomy College Of Medicine Kyung Hee University
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Lee Jaeho
Inter-University Semiconductor Research Center (ISRC), School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Korea
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Jang Seunghyun
Inter-University Semiconductor Research Center (ISRC), School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Korea
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Jung Keum-Dong
LCD R&D Center, Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Korea
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Park Mun-Soo
LCD R&D Center, Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Korea
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Yoo Moon-Hyun
LCD R&D Center, Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Korea
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Yoo Moon-Hyun
LCD R&D Center, Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Korea
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Jung Keum-Dong
LCD R&D Center, Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Korea
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Park Mun-Soo
LCD R&D Center, Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Park Chan
Department of Electrical and Computer Engineering, Kwangwoon University, Gwangwoon-gil 26, Nowon-gu, Seoul 139-701, Korea
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Lee Hyunwoo
System LSI Division, Samsung Electronics, San #24 Nongseo-ri, Giheung-eup, Yongin, Gyeonggi-do 449-711, Korea
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Oh Hansu
System LSI Division, Samsung Electronics, San #24 Nongseo-ri, Giheung-eup, Yongin, Gyeonggi-do 449-711, Korea
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Kang Ho-Kyu
System LSI Division, Samsung Electronics, San #24 Nongseo-ri, Giheung-eup, Yongin, Gyeonggi-do 449-711, Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and Department of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Republic of Korea
著作論文
- Accurate Extraction of Excess Channel Thermal Noise Coefficient in Berkeley Short-Channel Insulated Gate Field-Effect Transistor Model 4
- Extraction of Electron Band Mobility in Amorphous Silicon Thin-Film Transistors