Zhu Shiyang | Research Center for Nanodevices and Systems, Hiroshima University, 1-4-2 Kagamiyama, Higashi-Hiroshima 739-8527, Japan

スポンサーリンク

概要

• Zhu Shiyangの詳細を見る
• 同名の論文著者
• Research Center for Nanodevices and Systems, Hiroshima University, 1-4-2 Kagamiyama, Higashi-Hiroshima 739-8527, Japanの論文著者

関連著者

• Zhu Shiyang

  Research Center For Nanodevices And Systems Hiroshima University

• Nakajima Anri

  Research Center For Nanodevices And Systems Hiroshima University

• Miyake Hideharu

  Elpida Memory Inc.

• Ohashi Takuo

  Elpida Memory Inc.

• Zhu Shiyang

  Research Center for Nanodevices and Systems, Hiroshima University, 1-4-2 Kagamiyama, Higashi-Hiroshima 739-8527, Japan

著作論文

• Modified Direct-Current Current-Voltage Method for Interface Trap Density Extraction in Metal-Oxide-Semiconductor Field-Effect-Transistor with Tunneling Gate Dielectrics at High Temperature

スポンサーリンク