KIM Youngmin | UNIST
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概要
関連著者
著作論文
- TSV Geometrical Variations and Optimization Metric with Repeaters for 3D IC
- A High Resolution and High Linearity 45 nm CMOS Fully Digital Voltage Sensor for Low Power Applications
- Trapezoidal approximation for on-current modeling of 45-nm non-rectilinear gate shape
- TSV Geometrical Variations and Optimization Metric with Repeaters for 3D IC