Yingguo Peng | Physics Department,Tokyo Institute of Technology
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概要
Physics Department,Tokyo Institute of Technology | 論文
- 22aT-13 High resolution REM study on structures of high index Si surfaces induced by metal deposition
- Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy
- Energy-filtered Electron Interferometry in Reflection Electron Microscopy
- Fabrication of Gold Nanowires Using Contact Mode Atomic Force Microscope
- New Phase Diagram of Step Instabilities on Si(111) Vicinal Surfaces Induced by DC Annealing : Condensed Matter: Structure, etc.