曽根 正人 | Precision and Intelligence Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
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Precision and Intelligence Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan | 論文
- InAs Quantum Dot Growth on a Thin GaNP Buffer Layer on GaP by Metalorganic Chemical Vapor Deposition
- Numerical Analysis of Ultrasonic Beam of Variable-Line-Focus-Beam Film Transducer
- High-Throughput Characterization Method for Crystallization Temperature of Integrated Thin Film Amorphous Alloys Using Thermography
- Evaluation of the Validity of Crystallization Temperature Measurements Using Thermography with Different Sample Configurations
- High-Throughput Measurement Method for Time--Temperature-Transformation Diagram of Thin Film Amorphous Alloys