Lien Chenhsin | Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.
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- Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.の論文著者
Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C. | 論文
- Tungsten Oxide Resistive Memory Using Rapid Thermal Oxidation of Tungsten Plugs
- Effect of Rapid Thermal Annealing in N2 and Stacked Layer on SiO2–Al2O3–SiO2 Characteristics for Interpoly Silicon Dielectrics
- Deposition and Characterization of Low-Stress Plasma Enhanced Chemical Vapor Deposition of Tetraethoxysilane Oxide for Micro-Electro-Mechanical-Systems Applications
- Superior Reliability of Gate-All-Around Polycrystalline Silicon Thin-Film Transistors with Vacuum Cavities Next to Gate Oxide Edges
- A Novel Ni/WOX/W Resistive Random Access Memory with Excellent Retention and Low Switching Current