MINAMIHABA G. | ULSI Research Laboratories, TOSHIBA Corporation

スポンサーリンク

概要

• MINAMIHABA G.の詳細を見る
• 同名の論文著者
• ULSI Research Laboratories, TOSHIBA Corporationの論文著者

ULSI Research Laboratories, TOSHIBA Corporation | 論文

• Two Correlated Mechanisms in Thin SiO_2 Breakdown
• Reliability of Structurally Modified Ultra-Thin Gate Oxides
• An Improved Bandgap Narrowing Model Based on Corrected Intrinsic Carrier Concentration
• Observation of Oxide-Thickness-Dependent Interface Roughness in Si MOS Structure
• Observation of Oxide Thickness Dependent Interface Roughness in Si MOS Structure

もっと見る

スポンサーリンク