Malic Babara | Electronic Ceramics Department, Jozef Stefan Institute, 39 Jamova, Ljubljana SI-1000, Slovenia

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• Electronic Ceramics Department, Jozef Stefan Institute, 39 Jamova, Ljubljana SI-1000, Sloveniaの論文著者

Electronic Ceramics Department, Jozef Stefan Institute, 39 Jamova, Ljubljana SI-1000, Slovenia | 論文

• Effect of Film Thickness on Electrical Properties of Chemical Solution Deposition-Derived Pb(ZrxTi1-x)O3/LaNiO3/Si
• Origin of Compressive Residual Stress in Alkoxide Derived PbTiO3 Thin Film on Si Wafer

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