スポンサーリンク
Electronic Ceramics Department, Jozef Stefan Institute, 39 Jamova, Ljubljana SI-1000, Slovenia | 論文
- Effect of Film Thickness on Electrical Properties of Chemical Solution Deposition-Derived Pb(ZrxTi1-x)O3/LaNiO3/Si
- Origin of Compressive Residual Stress in Alkoxide Derived PbTiO3 Thin Film on Si Wafer