Yokogawa Shinji | Test Analysis Technology Development Division, NEC Electronics Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki, Kanagawa 211-8668, Japan

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概要

• Yokogawa Shinjiの詳細を見る
• 同名の論文著者
• Test Analysis Technology Development Division, NEC Electronics Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki, Kanagawa 211-8668, Japanの論文著者

関連著者

• Yokogawa Shinji

  Test Analysis Technology Development Division Nec Electronics Corporation

• Yokogawa Shinji

  Test Analysis Technology Development Division, NEC Electronics Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki, Kanagawa 211-8668, Japan

著作論文

• Electromigration-Induced Void Growth Kinetics in SiNx-Passivated Single-Damascene Cu Lines

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