Yokogawa Shinji | Test Analysis Technology Development Division Nec Electronics Corporation
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概要
関連著者
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Yokogawa Shinji
Test Analysis Technology Development Division Nec Electronics Corporation
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Yokogawa Shinji
Test Analysis Technology Development Division, NEC Electronics Corporation, 1753 Shimonumabe, Nakahara, Kawasaki, Kanagawa 211-8668, Japan
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Yokogawa Shinji
Test Analysis Technology Development Division, NEC Electronics Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki, Kanagawa 211-8668, Japan
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Tsuchiya Hideaki
Test Analysis Technology Development Division, NEC Electronics Corporation, 1753 Shimonumabe, Nakahara, Kawasaki, Kanagawa 211-8668, Japan
著作論文
- Electromigration-Induced Void Growth Kinetics in SiNx-Passivated Single-Damascene Cu Lines
- Scaling Impacts on Electromigration in Narrow Single-Damascene Cu Interconnects