Nakamura Kiyoshi | Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
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Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan | 論文
- Ultrasonic Microspectroscopy Characterization of AIN Single Crystals
- Surface Acoustic Wave Properties of Amorphous Ta2O5 and Nb2O5 Thin Films Prepared by Radio Frequency Sputtering
- Determination Method of Acoustical Physical Constants and Their Temperature Coefficients of La_3Ta_Ga_Al_O_ Single Crystal
- Experimental Investigation of Effect of Channel Doping Concentration on Random Telegraph Signal Noise
- Analysis of Hundreds of Time Constant Ratios and Amplitudes of Random Telegraph Signal with Very Large Scale Array Test Pattern