Ge Chung-Hu | Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, R.O.C.

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概要

• Ge Chung-Huの詳細を見る
• 同名の論文著者
• Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, R.O.C.の論文著者

関連著者

• Huang Tiao-yuan

  Institute Of Electronics National Chiao Tung University

• Ko Chih-hsin

  Taiwan Semiconductor Manufacturing Company Ltd.

• Ge Chung-hu

  Taiwan Semiconductor Manufacturing Company Ltd.

• Lin Hong-nien

  Institute Of Electronics National Chiao-tung University

• Ko Chih-Hsin

  Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, R.O.C.

• Ge Chung-Hu

  Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, R.O.C.

• Lin Horng-chih

  Institute Of Electronics National Chiao Tung University

• Lin Horng-chih

  National Nano Device Laboratories

• Lin Horng-chih

  National Nano Device Lab.

• Huang Tiao-yuan

  Institute Of Electronics National Chiao-tung University

• HUANG Chien-Chao

  Taiwan Semiconductor Manufacturing Company

• LIN Hong-Nien

  Institute of Electronics, National Chiao-Tung University

• GE Chung-Hu

  Taiwan Semiconductor Manufacturing Company, Ltd.

• LIN C.-C.

  Taiwan Semiconductor Manufacturing Company, Ltd.

• Huang Chien-chao

  Taiwan Semiconductor Manufacturing Company Ltd.

• Lin C.-c.

  Taiwan Semiconductor Manufacturing Company Ltd.

• Lin Horng-chih

  National Chiao Tung University

• Lee Wen-Chin

  Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, R.O.C.

• Huang Tiao-Yuan

  Institute of Electronics, National Chiao-Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30050, Taiwan, R.O.C.

• Chen Hung-Wei

  Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, R.O.C.

• Lin Hong-Nien

  Institute of Electronics, National Chiao-Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30050, Taiwan, R.O.C.

• Lin Horng-Chih

  Institute of Electronics, National Chiao-Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30050, Taiwan, R.O.C.

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著作論文

• Effect of Strain on Static and Dynamic NBTI of pMOSFETs
• Characterizing the Channel Backscattering Behavior in Nanoscale Strained Complementary Metal Oxide Semiconductor Field-Effect Transistors

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