Ge Chung-hu | Taiwan Semiconductor Manufacturing Company Ltd.
スポンサーリンク
概要
関連著者
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Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University
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Ko Chih-hsin
Taiwan Semiconductor Manufacturing Company Ltd.
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Ge Chung-hu
Taiwan Semiconductor Manufacturing Company Ltd.
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Lin Hong-nien
Institute Of Electronics National Chiao-tung University
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Ko Chih-Hsin
Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, R.O.C.
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Ge Chung-Hu
Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, R.O.C.
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Lin Horng-chih
Institute Of Electronics National Chiao Tung University
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Lin Horng-chih
National Nano Device Laboratories
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Lin Horng-chih
National Nano Device Lab.
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Huang Tiao-yuan
Institute Of Electronics National Chiao-tung University
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HUANG Chien-Chao
Taiwan Semiconductor Manufacturing Company
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LIN Hong-Nien
Institute of Electronics, National Chiao-Tung University
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GE Chung-Hu
Taiwan Semiconductor Manufacturing Company, Ltd.
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LIN C.-C.
Taiwan Semiconductor Manufacturing Company, Ltd.
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Huang Chien-chao
Taiwan Semiconductor Manufacturing Company Ltd.
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Lin C.-c.
Taiwan Semiconductor Manufacturing Company Ltd.
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Lin Horng-chih
National Chiao Tung University
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Lee Wen-Chin
Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, R.O.C.
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Huang Tiao-Yuan
Institute of Electronics, National Chiao-Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30050, Taiwan, R.O.C.
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Chen Hung-Wei
Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, R.O.C.
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Lin Hong-Nien
Institute of Electronics, National Chiao-Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30050, Taiwan, R.O.C.
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Lin Horng-Chih
Institute of Electronics, National Chiao-Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30050, Taiwan, R.O.C.
著作論文
- Effect of Strain on Static and Dynamic NBTI of pMOSFETs
- Characterizing the Channel Backscattering Behavior in Nanoscale Strained Complementary Metal Oxide Semiconductor Field-Effect Transistors