Kim Hyeong-Jun | Division of Materials Science and Engineering, Seoul National University
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Division of Materials Science and Engineering, Seoul National University | 論文
- A Comparison of the Kinetics and the Evolution of Microstructure of the Solid Phase Crystallized a-(Si_Ge_/Si) and a-(Si/Si_Ge_) Bilayer Films; Interface versus Surface Nucleated Films
- Reducing the Thermal Budget of Solid Phase Crystallization of Amorphous Si Film Using Si_Ge_ Seed Layer
- Device Characteristics of Polycrystalline Si_Ge_ Thin Film Transistors Grown from Si_2H_6 and GeH_4 Source Gases
- Characterization of magnetoresistance in ferromagnetic/oxide/ferromagnetic structured thin films
- Characterization of magnetoresistance in ferromagnetic/oxide/ferromagnetic structured thin films