SAKIYAMA Keizo | VLSI Development Laboratories, IC Tenri Group, SHARP Corporation
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概要
VLSI Development Laboratories, IC Tenri Group, SHARP Corporation | 論文
- FN Program Technology of Sector Erasable Flash Memory with Conventional 2-Layer Poly Silicon ETOX Cell Structure
- Drain Disturb Relaxation by Substrate bias Selecting Scheme for Sector Erase Flash Memory with Conventional Single Stacked Gate Cell Structure
- A Flash Memory Technology for Operating Voltage Reduction and Self-Convergence of the Over Erased Cells