Ohtake Hiroshi | NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan | 論文
- Soft X-ray Charging Method for a Silicon Electret Condenser Microphone
- Analysis of the Influence of Sputtering Damage to Polymer Gate Insulators in Amorphous InGaZnO4 Thin-Film Transistors
- A $128\times 96$ Pixel Stack-Type Color Image Sensor: Stack of Individual Blue-, Green-, and Red-Sensitive Organic Photoconductive Films Integrated with a ZnO Thin Film Transistor Readout Circuit
- New Driving Scheme to Improve Hysteresis Characteristics of Organic Thin Film Transistor-Driven Active-Matrix Organic Light Emitting Diode Display
- Influence of Oxide Semiconductor Thickness on Thin-Film Transistor Characteristics