SUGII Kiyomasa | Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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- 同名の論文著者
- Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporationの論文著者
Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation | 論文
- Effect of Growth Temperature on Si MBE Film
- Metallic Contamination from Wafer Handling
- The Distribution of the Excess Vacancies in the Bulk at the Diffusion of Phosphorus into Silicon
- Phosphorus Diffusion in Silicon Free from the Surface Effect under Extrinie Conditions
- Ionizing Radiation Effects in MOS Capacitors with Very Thin Gate Oxides