TSUYA Hideki | Research and Development Center, Sitix Division, Sumitomo Metal Industries Ltd.
スポンサーリンク
概要
関連著者
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YANASE Yoshio
Research and Development Center, Sumitomo Sitix Corporation
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TSUYA Hideki
Research and Development Center, Sumitomo Sitix Corporation
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Yanase Yoshio
Research And Development Center Sitix Division Sumitomo Metal Industries Ltd.
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TSUYA Hideki
Research and Development Center, Sitix Division, Sumitomo Metal Industries Ltd.
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Ochiai T
Research And Development Center Sumitomo Sitix Corporation
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OCHIAI Takashi
Research and Development Center, Sumitomo Sitix Corporation
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Tsuya H
Research And Development Center Sitix Division Sumitomo Metal Industries Ltd.
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Ono Toshiaki
Research And Development Center Sumitomo Sitix Corporation
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Sano M
Sumitomo Metal Ind. Ltd. Saga Jpn
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Horie H
Fujitsu Lab. Ltd. Atsugi Jpn
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Horie Hiroshi
Research And Development Center Sumitomo Sitix Corporation
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Kitamura Takuya
Department Of Physical Electronics Tokyo Institute Of Technology
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NISHIHATA Hideki
Research and Development Center, Sumitomo Sitix Corporation
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KITAMURA Takafumi
Research and Development Center, Sumitomo Sitix Corporation
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OKAMOTO Setsuo
Research and Development Center, Sumitomo Sitix Corporation
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Kitamura T
Murata Mfg. Co. Ltd. Kyoto Jpn
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Okamoto Setsuo
Research And Development Center Sumitomo Sitix Corporation
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Umeno Shigeru
Research and Development Center, Sitix Division, Sumitomo Metal Industries Ltd.
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Hourai Masataka
Research and Development Center, Sitix Division, Sumitomo Metal Industries Ltd.
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Sano Masakazu
Research and Development Center, Sitix Division, Sumitomo Metal Industries Ltd.
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Shida Yoshiaki
Research and Development Center, Sitix Division, Sumitomo Metal Industries Ltd.
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Hourai M
Research And Development Center Sitix Division Sumitomo Metal Industries Ltd.
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Umeno Shigeru
Research And Development Center Sitix Division Sumitomo Metal Industries Ltd.
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Shida Yoshiaki
Research And Development Center Sitix Division Sumitomo Metal Industries Ltd.
著作論文
- Atomic force Microscope Observation of the Change in Shape and Subsequent Disappearance of "Crystal-Originated Particles" after Hydrogen-Atmosphere Thermal Annealing
- A New Method for Transmission Electron Microscope Observation of Grown-in Defects in As-Grown Czochralski Silicon (111) Crystals
- Dependence of Grown-in Defect Behavior on Oxygen Concentration in Czoehralski Silicon Crystals