AHMED Haroon | Microelectronics Research Center, Cavendish Laboratory:CREST, Japan Science and Technology (JST)

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概要

• 同名の論文著者
• Microelectronics Research Center, Cavendish Laboratory:CREST, Japan Science and Technology (JST)の論文著者

関連著者

• MIZUTA Hiroshi

  Hitachi Cambridge Laboratory

• Ahmed Haroon

  Microelectronics Research Center Cavendish Laboratory:crest Japan Science And Technology (jst)

• EVANS Gareth

  Microelectronics Research Center, Cavendish Laboratory

• AHMED Haroon

  Microelectronics Research Center, Cavendish Laboratory:CREST, Japan Science and Technology (JST)

著作論文

• Modelling of Structural and Threshold Voltage Characteristics of Randomly Doped Silicon Nanowires in the Coulomb-Blockade Regime : Semiconductors

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