Fang Yean-Kuen | VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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概要
- Fang Yean-Kuenの詳細を見る
- 同名の論文著者
- VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwanの論文著者
関連著者
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Fang Yean-kuen
Vlsi Technology Lab. Institute Of Microelectronics Ee Department National Cheng Kung University No.
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Fang Yean-Kuen
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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Chiang Yen-ting
Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering Nation
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Shen Tsong
United Microelectronics Corporation (umc) Specialty Technology Division
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Ko Joe
United Microelectronics Corporation (umc) Specialty Technology Division
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Sheu Yau
United Microelectronics Corporation (umc) Specialty Technology Division
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Tang Mao-chyuan
Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering Nation
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Liao Wen
United Microelectronics Corporation (umc) Specialty Technology Division
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Lee Tung-hsing
Vlsi Technology Lab. Institute Of Microelectronics Ee Department National Cheng Kung University No.
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Lin Chien-Ting
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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Chen Ming-Shing
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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Ko Joe
United Microelectronics Corporation (UMC), Specialty Technology Division, No. 3, Li-Hsin Rd. II, Hsinchu 300, Taiwan
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Chiang Yen-Ting
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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Liao Wen
United Microelectronics Corporation (UMC), Specialty Technology Division, No. 3, Li-Hsin Rd. II, Hsinchu 300, Taiwan
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Shen Tsong
United Microelectronics Corporation (UMC), Specialty Technology Division, No. 3, Li-Hsin Rd. II, Hsinchu 300, Taiwan
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Liao Wen-Shiang
Advanced Technology Development Division, United Microelectronics Corp., Tainan 741, Taiwan
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Lee Tung-Hsing
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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Chen David
Advanced Technology Development Division, United Microelectronics Corp., Tainan 741, Taiwan
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Sheu Yau
United Microelectronics Corporation (UMC), Specialty Technology Division, No. 3, Li-Hsin Rd. II, Hsinchu 300, Taiwan
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Yeh Chune-Sin
Advanced Technology Development Division, United Microelectronics Corp., Tainan 741, Taiwan
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Chien Shan-Chieh
Advanced Technology Development Division, United Microelectronics Corp., Tainan 741, Taiwan
著作論文
- Effect of Etch Stop Layer Stress on Negative Bias Temperature Instability of Deep Submicron p-Type Metal–Oxide–Semiconductor Field Effect Transistors with Dual Gate Oxide
- Effects of Hot Carriers on DC and RF Performances of Deep Submicron p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors with Various Oxide Layer Thicknesses