Weng Wu-Te | Institute of Electronics, National Chiao Tung University, 1001, Ta-Hsueh Rd., Hsinchu 300, Taiwan

スポンサーリンク

概要

関連著者

LEE Yao-Jen
National Nano Device Laboratories
Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University
Lin Hong-Chih
Institute of Electronics, National Chiao Tung University, 1001, Ta-Hsueh Rd., Hsinchu 300, Taiwan
Huang Tiao-Yuan
Institute of Electronics, National Chiao Tung University, 1001, Ta-Hsueh Rd., Hsinchu 300, Taiwan
Weng Wu-Te
Institute of Electronics, National Chiao Tung University, 1001, Ta-Hsueh Rd., Hsinchu 300, Taiwan

著作論文

Effects of Plasma Damage on Metal–Insulator–Metal Capacitors and Transistors for Advanced Mixed-Signal/Radio-Frequency Metal–Oxide–Semiconductor Field-Effect Transistor Technology

スポンサーリンク