Miura Kensuke | Graduate School of Information Science and Technology, and Research Center for Integrated Quantum Electronics, Hokkaido University, Sapporo 060-0814, Japan
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概要
- Miura Kensukeの詳細を見る
- 同名の論文著者
- Graduate School of Information Science and Technology, and Research Center for Integrated Quantum Electronics, Hokkaido University, Sapporo 060-0814, Japanの論文著者
関連著者
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Shiratori Yuta
Graduate School Of Information Science And Technology And Research Center For Integrated Quantum Ele
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Miura Kensuke
Graduate School of Information Science and Technology, and Research Center for Integrated Quantum Electronics, Hokkaido University, Sapporo 060-0814, Japan
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Kasai Seiya
Graduate School of Electronics and Information Engineering, and Research Center
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Yatabe Zenji
Lab. De Thermodyn. Et Energe. Des Flu. Comp. Umr Total Cnrs 5150 Univ.
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Shiratori Yuta
Research Center For Integrated Quantum Electronics And Graduate School Of Information Science And Te
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Miura Kensuke
Research Center For Integrated Quantum Electronics And Graduate School Of Information Science And Te
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Kasai Seiya
Research Center For Integrated Quantum Electronics And Graduate School Of Information Science And Te
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Kasai Seiya
Graduate School Of Information Science And Technology And Research Center For Integrated Quantum Ele
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谷田部 然治
北海道大学 大学院情報科学研究科 および 量子集積エレクトロニクス研究センター
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Shiratori Yuta
Graduate School of Information Science and Technology, and Research Center for Integrated Quantum Electronics, Hokkaido University, Sapporo 060-0814, Japan
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Yatabe Zenji
Graduate School of Information Science and Technology, and Research Center for Integrated Quantum Electronics, Hokkaido University, Sapporo 060-0814, Japan
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Muramatsu Toru
Graduate School of Information Science and Technology, and Research Center for Integrated Quantum Electronics, Hokkaido University, Sapporo 060-0814, Japan
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谷田部 然治
北海道大学 量子集積エレクトロニクス研究センター
著作論文
- Characterization of low-frequency noise in GaAs nanowire field-effect transistors controlled by Schottky wrap gate (Special issue: Microprocesses and nanotechnology)
- Characterization of Low-Frequency Noise in Etched GaAs Nanowire Field-Effect Transistors Having SiNx Gate Insulator