SATO Mitsugu | Naka Division, Hitachi High-Technologies Corporation
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概要
Naka Division, Hitachi High-Technologies Corporation | 論文
- Monte Carlo simulation of topographic contrast in scanning ion microscope
- Improvements in performance of focused ion beam cross-sectioning : aspects of ion-sample interaction
- Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy
- Simulation study on image contrast and spatial resolution in helium ion microscope
- Contrast-to-gradient method for the evaluation of image resolution in scanning electron microscopy