JUNG Woong | Department of Semiconductor Science, Dongguk University
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概要
Department of Semiconductor Science, Dongguk University | 論文
- Specific Heat Study of GaMnAs
- Effects of Ultrathin Al Layer Insertion on Resistive Switching Performance in an Amorphous Aluminum Oxide Resistive Memory
- DEGRADATION MECHANISM OF ELECTRON EMISSION CHARACTERISTICS IN SILICON FIELD EMITTERS
- Dependence of Structural and Electrical Properties on Substrate Temperature for Annealed C54 TiSi_2 Thin Films Grown on p-Si Substrates
- Dependence of Structural and Electrical Properties on Substrate Temperature for Annealed C54 TiSi2 Thin Films Grown on p-Si Substrates