Su Yan-Kuin | Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan

スポンサーリンク

概要

関連著者

WANG Chun-Kai
Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University
Chiou Yu-zung
Department Of Electrical Engineering National Cheng Kung University
Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
Gong Jeng
Institute Of Electronic Engineering National Tsing Hua University
Su Yan-kuin
Institute Of Electro-optical Science And Engineering Advance Optoelectronics Technology Center Natio
Wang Chun-Kai
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
Chiou Yu-Zung
Department of Electronics Engineering, Southern Taiwan University of Technology, Tainan 710, Taiwan
Su Yan-Kuin
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
Chang Shoou-Jinn
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan

著作論文

Noise Analysis of Nitride-Based Metal–Oxide–Semiconductor Heterostructure Field Effect Transistors with Photo-Chemical Vapor Deposition SiO2 Gate Oxide in the Linear and Saturation Regions

スポンサーリンク