YAMADA Ryuta | Department of Precision Science and Technology, School of Engineering, Osaka University

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• YAMADA Ryutaの詳細を見る
• 同名の論文著者
• Department of Precision Science and Technology, School of Engineering, Osaka Universityの論文著者

Department of Precision Science and Technology, School of Engineering, Osaka University | 論文

• Characterization of Patterned Oxide Buried in Bonded Silicon-on-Insulator Wafers by Near-Infrared Scattering Topography and Microscopy
• C-12-5 Methodology for Layout-Based Diagnosis of VLSI Chips Considering Temperature Distribution

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